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Advances in Metrology for X-Ray and Euv Optics: 2-3 August, 2005, San Diego, California, USA
by (Other Contributor: Society Of Photo-Optical Instrumentation)
Product Group: Book
Publisher: SPIE-International Society for Optical Engine (2005-01)
ISBN: 0819459267
EAN: 9780819459268
Paperback: 1 pages
Condition: Very Good
Comments: "BUY WITH CONFIDENCE, Over one million books sold! 98% Positive feedback. Compare our books, prices and service to the competition. 100% Satisfaction Guaranteed!"
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